Course Construction of "Design of Application-Specific Integrated Circuit" 非微电子专业专用集成电路设计课程建设研究
This paper presents a DFT method named HAM ( hierarchical-analysis method) for application-specific VAD ( video add data) integrated circuit. Low test overhead and the high fault coverage can be achieved by using HAM. 通过对这些可测性设计方法的研究,该文提出一种测试开销低、测试故障覆盖率高的层次化分析法来实现专用VAD(Videoadddata)集成电路的可测性设计。
This paper studys and discusses how to offer the course of "Design of Application-Specific Integrated Circuit". 本文针对非微电子专业本科如何开设专用集成电路设计课程进行研究和探讨。